Dr John Walton

As Surface Analysis Co-ordinator John manages the X-ray photoelectron spectrometer and atomic force microscopes facilities in the school. He has extensive experience in surface analysis, and prior to his appointment as an EO in 1985, was employed as a user support scientist at the Synchrotron Light Source, Daresbury.

He was promoted to SEO in 1992, and to his present position in 2003.

• The application of multivariate analytical techniques to X-ray photoelectron spectroscopic imaging.

• Peak Fitting with CasaXPS, John Walton, Paul Wincott, Neal Fairley and Alan Carrick, Acolyte Science, Knutsford, Uk, 2010, ISBN 978-0954953317
• Surface modification of pyrolyzed carbon fibres by cyclic voltammetry and their characterisation with XPS and dye absorption P. Georgiou, J. Walton and J. Simitzis Electrochimica Acta 2010: 55; 1207 doi:10.1016/j.electacta.2009.09.068
• Noise reduction procedures applied to XPS imaging of depth distribution of atoms on the nanoscale S. Hajati, S. Tougaard, J.Walton and N. Fairley Surface Science 2008: 602; 3064-3070 doi:10.1016/j.susc.2008.08.005
• Characterisation of a Kratos Axis Ultra with spherical mirror analyser for XPS imaging J. Walton and N Fairley Surface and Interface Analysis 2006: 38, 8, 1230-1235 doi:10.1002/sia.2381
• Transmission function correction for XPS spectrum imaging J. Walton and N. Fairley Proceedings ECASIA'05 (Vienna, 2005) Surface and Interface Analysis 2006:38:388-391 doi:10.1002/sia.2131
• Noise reduction in X-ray photoelectron spectromicroscopy by a singular value decomposition sorting procedure J. Walton and N. Fairley Journal of Electron Spectroscopy and Related Phenomena 2005: 148; 29-40 doi:10.1016/j.elspec.2005.02.003
• Quantitative surface chemical state microscopy by X-ray photoelectron spectroscopy. J. Walton and N. Fairley Surface and Interface Analysis 2004: 36: 89-91 doi:10.1012/sia.1654

http://personalpages.manchester.ac.uk/staff/john.walton/