Dr Sarah Haigh

My research focuses on studying the structure and properties of nanomaterials principally using transmission electron microscopy (TEM). I have worked extensively on the development of a more quantitative approach to TEM using aberration corrected imaging and restoration techniques to determine the form of the full complex electron wave. I have also used these techniques to achieve higher resolution than is possible in a single axial image and to improve imaging of beam sensitive materials.

I am a member of the Nanostructure Material Group and the Materials School and collaborate with a number of academics here. I completed my undergraduate and doctoral degrees in the Department of Materials, University of Oxford and continue to collaborate with Professor Angus Kirkland and Dr Neil Young in Oxford. I also have current collaborations with the following colleagues:

• Prof. Paul O'Brien, School of Chemistry, University of Manchester
• Dr Jason Smith, Mr Simon Fairclough, Department of Materials, University of Oxford
• Prof. Osamu Terasaki, Miss Miia Klingstedt, University of Stockholm
• Dr. Sandra Van Aert, EMAT, University of Antwerp.

• Surface structure determination for metal, metal-oxide and semiconductor nanoparticles using TEM, EELS, and EDS analysis
• Structural understanding of novel intergrowth tungsten bronze materials
• Understanding structural defects in graphene and related two dimensional nanomaterials
• Application of exit wave restoration technique to structure determination for beam-sensitive materials such as zeolitic catalysts

• S.J.Haigh, H.Sawada, A.I.Kirkland, Exceeding Conventional Resolution Limits in High Resolution Transmission Electron Microscopy Using Tilted Illumination and Exit Wave Restoration, Microscopy and Microanalysis, 2009, In Press
• Haigh, Sarah J. and Sawada, Hidetaka and Kirkland, Angus I. Atomic Structure Imaging Beyond Conventional Resolution Limits in the Transmission Electron Microscope, Physical Review Letters, 103,12, 126101-4, 2009
• S.J.Haigh, H.Sawada, A.I.Kirkland, Optimal Conditions for Aberration Corrected Super Resolution Exit Wavefunction Reconstruction. Philosophical Transactions of the Royal Society, A Mathematical, Physical and Engineering Sciences 367,1903, 3755-3771, 2009
• J.Watt, N.Young, S.J.Haigh, A.I.Kirkland and R.D.Tilley. Synthesis and Structural Characterization of Branched Palladium Nanostructures, Advanced Materials 21, 22, 2288-2292, 2009
• A.I.Kirkland, L.Y.Chang, S.Haigh, C.Hetherington, Transmission Electron Microscopy without Aberrations: Applications to Materials Science. Current Applied Physics, 8, 425-428, 2008
• C.J.D.Hetherington, L.Y.Chang, S.Haigh, P.D.Nellist, L.Cervera Gontard, R.E.Dunin-Borkowski and A.I. Kirkland, High-Resolution TEM and the Application of Direct and Indirect Aberration Correction, Microscopy and Microanalysis, 2008 14 (01).60-67.
• A.I.Kirkland, S.Haigh and J.Sloan, Ultrahigh resolution Imaging of Local Structural Distortions in Intergrowth Tungsten Bronzes, Ultramicroscopy, 107, 501, 2007.
• T.Prikhna, W.Gawalek, Y.Savchuk, N.Sergienko, V.Moshchil, C.R.M.Grovenor, S.Dub, S.J.Haigh, et al. High-pressure high-temperature synthesis of nanostructural magnesium diboride for electromotors and devices working at liquid hydrogen temperatures, Advances in Science and Technology 47 25-30 2006
• S.J. Haigh, P.Kovac, T.A.Prikhna, Y.M.Savchuk, M.R.Kilburn, C.Salter, J.Hutchison, C.Grovenor Chemical interactions in Ti doped MgB2 superconducting bulk samples and wires, Superconductor Science and Technology 18 (9) 1190-1196 2005
• P.Kovac, I.Husek, T.Melisek, C.R.M.Grovenor, S.J.Haigh, H.Jones, Improvement of the current carrying capability of ex situ MgB2 wires by normal particle additions, Superconductor Science and Technology 17 (11) 1225-1230 2004
• A.I.Kirkland, P.D.Nellist, L-Y Chang, S.J.Haigh Chapter 8: Aberration Corrected Imaging in Conventional Transmission Electron Microscopy, in Advances in Imaging and Electron Physics, 153, pp.283-325, 2008
• S.J.Haigh A.I.Kirkland, Chapter 9: Aberration Corrected CTEM in A Handbook of Aberration Corrected STEM. Ed. Rik Brydson (Publication date : 1st June 2010 ).
• Haigh, S.J and Kirkland, A. I., Finding Phase information from the darkness, Electron Microscopy and Analysis Group Conference 2009 SEP 08-11, 2009, Birmingham Univ, U.K.
• S.J.Haigh, L.Y. Chang, H.Sawada, N.P.Young, A.I.Kirkland, New Considerations for exit wavefunction restoration under aberration corrected conditions. Proceeding of the 14th European Microscopy Congress, Aachen, 1. 765, 2008.
• S.J.Haigh, A.I.Kirkland and L.Y.Chang Aberration Corrected Tilt Series Restoration, Journal of Physics Conference Series 126 (2008) 012042 (4pp)
• A.I.Kirkland, S.J.Haigh and L.Y.Chang Aberration corrected TEM: Current Status and Future Prospects, Journal of Physics: Conference Series 126 (2008) 012034 (6pp)
• S.J.Haigh, A.I.Kirkland and L.Y.Chang. Aberration Corrected Tilt Series Reconstruction In Proceedings of 16th International Microscopy Congress 2006, Sapporo H.Ichinose and T.Sasaki, (Eds.) 943
• S.J Haigh, B. Jiang, D. Alloyeau, C. Kisielowski, A.I.Kirkland Recording low spatial frequencies while maintaining information limit resolution using the TEAM I microscope, Microscopy and Microanalysis, Richmond, Virginia, August 2010 (in submission)
• S. Haigh, L P Stoter, H. Sawada and A.I.Kirkland, Aberration Corrected Transmission Electron Microscopy and the Characterisation of Nanomaterials, NanoAfrica 2009, 1 - 4 February 2009, CSIR International Conference Centre, Pretoria, South Africa
• S.J.Haigh, A.I.Kirkland and L.Y.Chang, Aberration Corrected Tilt Series Reconstruction, Microscopy and Microanalysis, 13, 2, 876, 2007.
• A.I.Kirkland, L.Y.Chang, S.J.Haigh, and C.J.D.Hetherington, Imaging and Exit Wave Reconstruction in an Aberration-Free Environment, 11th Meeting on Frontiers of Electron Microscopy in Materials Science, SEP 23-28, 2007